[19a-143-1~8] 6.6 Probe Microscopy

[19a-143-6] (16x2) Reconstruction on Si(110) Surface Studied by Atomic Force Microscopy

〇Tatsuya Yamamoto¹, Ryo Izumi¹, Katsuharu Matsumoto¹, Yoshitaka Naitoh¹, YanJun Li¹, Yasuhiro Sugawara¹, Kazushi Miki² (1.Osaka Univ., 2.Hyogo Univ.)

Keywords:atomic force microscopy, Si(110), surface, vacuum

Si(110)-(16x2) surface reconstruction is now expected as a promising template for self-assembled nanowires. Although this reconstruction has been studied a lot by scanning tunneling microscopy and other powerful tools in order to clarify the structural model, the structural model is still unknown. In this report, by using atomic force microscopy we scanned Si(110)-(16x2). From the data obtained, we will discuss the structural model.