[19p-PB3-1~14] 6.6 Probe Microscopy

[19p-PB3-13] Investigation of carrier dynamics in organic thin-film transistors by Kelvin-probe force microscopy for compared bottom contact type with top contact type

〇Masahiro Takeshita¹, Kouichi Innami¹, Tsutau Yokocho¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

Keywords:OTFT, KFM