[18p-224B-1~11] 17.3 Layered materials

[18p-224B-11] Carrier distribution imaging on exfoliated WSe₂/SiO₂ using scanning nonlinear dielectric microscopy and electrostatic force microscopy

〇Kohei Yamasue¹, Toshiaki Kato², Toshiro Kaneko², Yasuo Cho¹ (1.RIEC, Tohoku Univ., 2.Grad. Sch. Eng., Tohoku Univ.)

Keywords:layered material, scanning nonlinear dielectric microscopy, transition metal dichalcogenide

In the charge carrier distribution imaging of WSe₂ mechanically exfoliated on SiO₂ by scanning nonlinear dielectric microscopy (SNDM), the polarity of charge carriers is different for different polarities in dc-bias voltages. In this presetation, we investigate the generation mechanism of the observed carriers based on the combined use of electrostatic force microscopy (EFM) and SNDM.