The 79th JSAP Autumn Meeting, 2018

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15 Crystal Engineering » 15.7 Crystal characterization, impurities and crystal defects

[19p-131-1~15] 15.7 Crystal characterization, impurities and crystal defects

Wed. Sep 19, 2018 1:30 PM - 5:45 PM 131 (131+132)

Kentaro Kutsukake(Nagoya Univ.), Toshinori Taishi(Shinshu Univ.), Yasuo Shimizu(Tohoku Univ.)

1:45 PM - 2:00 PM

[19p-131-2] Observations of the defect distributions in Si-CZ crystals detached from the melt using the rapid cooling and the slow cooling heat shield

〇Takao Abe1, Toru Takahashi1, Koun Shirai2 (1.ShinEtsu Handotai, 2.ISIR, Osaka Univ.)

Keywords:point defects in Si