The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.1 Ferroelectric thin films

[19p-133-1~19] 6.1 Ferroelectric thin films

Wed. Sep 19, 2018 1:45 PM - 7:00 PM 133 (133+134)

Tomoaki Yamada(Nagoya Univ.), Takeshi Yoshimura(Osaka Pref. Univ.), Takashi Eshita(Wakayama Univ.), Hiroshi Naganuma(Tohoku Univ.)

6:00 PM - 6:15 PM

[19p-133-16] Verification of shift current independent on carrier mobility by optimizing electrodes

〇(M1)Hiroki Hatada1, Masao Nakamura2,3, Yoshio Kaneko2, Naoki Ogawa2,3, Yoshinori Tokura1,2, Masashi Kawasaki1,2 (1.Univ. of Tokyo, 2.RIKEN-CEMS, 3.JST-PRESTO)

Keywords:shift current, photovoltaic effect, ferroelectric material

Crystals with broken inversion symmetry, as typified by ferroelectric materials, are known to show photovoltaic effect. Recently, the origin of this effect is theoretically revealed to be so-called the shift current. Shift current is a topological photocurrent insensitive to the carrier mobility in the bulk crystals, which is a sharp contrast with conventional photocurrent. However, the distinctive feature of shift current has not been fully verified in experiments, presumably due to the formation of Schottky barrier at the sample-electrode interface. In this study, we investigated in detail the impact of electrodes on the extraction of shift current using a representative ferroelectric semiconductor SbSI. By reducing the effect of Schottky barrier, we succeeded in observing photocurrent whose magnitude is independent of the mobility. This is a first clear indication of the dissipation-less nature of the shift current.