The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

16 Amorphous and Microcrystalline Materials » 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[19p-231A-1~8] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

Wed. Sep 19, 2018 1:15 PM - 3:30 PM 231A (231-1)

Tamihiro Gotoh(Gunma Univ.), Norimitsu Yoshida(Gifu Univ.)

1:45 PM - 2:00 PM

[19p-231A-3] Understanding the Electronic Structure of Transition-Metal Based Phase-Change Material for Non-Volatile Memory Application

Yuta Saito1, Yuji Sutou2, Paul Fons1, Alexander V. Kolobov1, Satoshi Shindo3, Shogo Hatayama2, Shuang Yi2, Xeniya Kozina4, Jonathan M. Skelton5, Keisuke Kobayashi6 (1.AIST, 2.Tohoku Univ., 3.Tohoku Univ.(Present:Nagaoka Univ. Tech.), 4.Helmholtz-Zentrum, 5.Univ. Bath, 6.JASRI)

Keywords:phase-change material, electronic structure, chalcogenide

Electronic structure of a transition-metal based Cu2GeTe3 chalcogenide phase-change material was investigated using hard x-ray photoelectron spectroscopy as well as density functional theory calculations. It was found that Cu d-electrons are playing an important role during the phase change process. This would pave the way for exploring novel phase-change materials for future non-volatile memory application.