[20a-133-1~8] 16.3 Bulk, thin-film and other silicon-based solar cells

[20a-133-3] Estimation by multilayer perceptron of dislocation regions in photoluminescence image of multicrystalline silicon

〇Hiroaki Kudo¹, Tetsuya Matsumoto¹, Kentaro Kutsukake², Noritaka Usami³ (1.Grad. Sc. Inf., Nagoya Univ., 2.Inst. Innov. Fut. Soc. , Nagoya Univ., 3.Grad. Sc. Eng., Nagoya Univ.)

Keywords:multilayer perceptron, dislocation, multicrystalline silicon

In this report, we studied a method based on multi-layer perceptron (MLP) to specify regions which were including dislocations in multicrystalline silicon wafers. Results of the cases changing input image sizes (input dimensions) of 1 wafer or 3wafers are reported.