The 79th JSAP Autumn Meeting, 2018

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13 Semiconductors » 13.8 Optical properties and light-emitting devices

[20a-235-1~8] 13.8 Optical properties and light-emitting devices

Thu. Sep 20, 2018 9:30 AM - 11:30 AM 235 (3Ｆ_Lounge２)

Jun Tatebayashi(Osaka Univ.)

11:00 AM - 11:15 AM

[20a-235-7] Automatic selective measurements of single-dot emission using real-time image analysis

〇Toshiyuki Ihara1, Atsushi Matsuda1 (1.NICT)

Keywords:single quantum dot, photoluminescence, image analysis