The 79th JSAP Autumn Meeting, 2018

Presentation information

Poster presentation

7 Beam Technology and Nanofabrication » 7 Beam Technology and Nanofabrication (7.1~7.5) (Poster)

[20a-PA1-1~11] 7 Beam Technology and Nanofabrication (Poster)

Thu. Sep 20, 2018 9:30 AM - 11:30 AM PA (Event Hall)

9:30 AM - 11:30 AM

[20a-PA1-1] Observationof Biological Specimen by Ultra-High Voltage Cryo-Electron Tomography

Naoko Kajimura1, Shota Inagaki2, 〇Kaoru Mitsuoka1 (1.EM Cen. Osaka Univ., 2.Osaka Univ.)

Keywords:electron microscopy, tomography, biological specimen

Recently, an ultra-high voltage electron microscope (EM) with cryo-stage in the column (JEM-1000EES, JEOL) at the accelerating voltage of 1 MeV was installed at Research Center for Ultra-High Voltage Electron Microscopy, Osaka University. Using the EM, electron tomography could be applied to the biological cryo-sample with micron thickness. Thus, we prepared cryo-grids of cultured cells, NG108-15, derived from rat neurons, and collected tomographic data from the biological sample. We reported the three-dimensional (3D) reconstructions of the cultured cells and compare them with the 3D reconstructions collected by a 300 kV EM.