A cryogenic system for testing quantum electron microscopy principles

Presentation information

Poster presentation

7 Beam Technology and Nanofabrication » 7 Beam Technology and Nanofabrication (7.1～7.5) (Poster)

Thu. Sep 20, 2018 9:30 AM - 11:30 AM PA (Event Hall)

9:30 AM - 11:30 AM

〇(M1C)Yukihiro Takayama¹, Yuki Okuda¹, Shigeo Miura¹, Hiroshi Okamoto¹ (1.Akita Pref Univ.)

Keywords:electronic microscope