[20a-PA6-1~9] 15.7 Crystal characterization, impurities and crystal defects

[20a-PA6-4] First-principles analysis of defect behavior related to the bulk lifetime
of silicon crystals for power device application

〇(M1)Daiki Tsuchiya¹, Koji Sueoka¹, Hidekazu Yamamoto² (1.OPU, 2.Chiba Tech)

Keywords:semiconductor