[20p-225B-1~5] Frontier of Cryo-Electron Microscopy

[20p-225B-5] Analysis for Cell Structure byusing Cryo STEM Tomography

〇Kazuhiro Aoyama Aoyama^1,2 (1.Thermo Fisher Sci., 2.UHVEM, Osaka Univ.)

Keywords:Cryo-Electron Microscopy, STEM Tomography

For 3D analysis by transmission electron microscope tomography, STEM has several advantages compared with normal TEM. In particular, since the thickness of a sample that can be analyzed up to about 3 times, it is very perfull for structural analysis at the cell level. It has also been cleard that a sufficient contrast can be obtained also in a cryo sample, therfore application in the future is expected. This technique will be introduced in detail.