2018年第79回応用物理学会秋季学術講演会

講演情報

シンポジウム(口頭講演)

シンポジウム » ナノエレクトロニクス材料・デバイス研究開発を目指した先端イオン顕微鏡技術

[20p-233-1~10] ナノエレクトロニクス材料・デバイス研究開発を目指した先端イオン顕微鏡技術

2018年9月20日(木) 13:30 〜 18:00 233 (233)

米谷 玲皇(東大)、小川 真一(産総研)

17:45 〜 18:00

[20p-233-10] Fabrication of optomechanical nanoresonators elastically coupled in series by focused-ion-beam for wavelength measurement

Kodai Tanaka1、Shin'ichi Warisawa1,2、Reo Kometani1,2 (1.Grad. Sch. of Eng., Univ. of Tokyo、2.Grad. Sch. of Front. Sci., Univ. of Tokyo)

キーワード:Focused-ion-beam, Resonator, Wavelength measurement

Nanomechanical resonators elastically coupled in series with half bull’s-eye structures were proposed for high resolution wavelength measurement. The device was fabricated by using focused-ion-beam (FIB). As a result nanomechanical resonators elastically coupled in series with half bull’s-eye structures are expected to achieve sensitive wavelength measurement.