The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

22 Joint Session M » 22.1 Joint Session M "Phonon Engineering"

[20p-234B-1~17] 22.1 Joint Session M "Phonon Engineering"

Thu. Sep 20, 2018 1:15 PM - 6:00 PM 234B (234-2)

Takanobu Watanabe(Waseda Univ.), Takahiro Yamamoto(Tokyo Univ. of Sci.), Toru Ujihara(Nagoya Univ.)

4:30 PM - 4:45 PM

[20p-234B-12] Heat Engineering of Planar Si-nanowire Thermoelectric Generator

〇(PC)Motohiro Tomita1, Takehiro Kumada1, Keisuke Shima1, Tianzhuo Zhan1, Hui Zhang1,2, Takashi Matsukawa3, Takeo Matsuki1,3, Takanobu Watanabe1 (1.Waseda Univ., 2.Gunma Univ., 3.AIST)

Keywords:semiconductor, thermoelectric generator, heat engineering

We demonstrated both numerically and experimentally that the sub-µm class short Si-NWs lying on the SiO2/Si-substrate of SOI wafer show high TE properties. However, the TE performance was found to be limited by the parasitic heat resistance of the SiO2 layer and the base-substrate. Most of the heat energy is dissipated in the thick substrate and thus the temperature difference in the short Si-NWs is drastically decreased. Further enhancement of the TE performance requires the engineering of the heat resistance in the substrate. In this study, we numerically investigated the effect of the thickness of the SiO2 insulating layer underneath Si-NWs and the base-substrate under the SiO2 layer by FEM simulations. Suppression of the base-substrate heat resistance is effective to increase the TE power density. Moreover, the tuning of the SiO2 insulating layer underneath the Si-NWs is also indispensable to establish a temperature difference in Si-NW for the best TE performance.