[21p-133-1~12] 16.3 Bulk, thin-film and other silicon-based solar cells

[21p-133-10] Effect of the tabbing condition of interconnectors on the degradation by a high temperature and high humidity test for crystalline Si PV modules

〇Yuji Ino¹, Shuichi Asao¹, Katsuhiko Shirasawa¹, Hidetaka Takato¹ (1.FREA, AIST)

Keywords:Crystalline silicon solar cell, Accelerated test, Interconnector

In the previous conference, we reported the effect of soldering flux on degradation along interconnectors which are observed in the Pressure cooker test (PCT), which is one of accelerated tests at high temperature and high humidity. In order to investigate the degradation mechanism, we report the results of PCT for the modules with the different tabbing conditions of interconnectors: the solder component, the tabbing position of interconnectors as well as the type and coating area of flux.