[21p-221A-1~6] 9.3 Nanoelectronics

[21p-221A-4] Optimization of Experimental Parameters for Fabrication of Au Atomic Junctions Using Artificial Intelligence Implemented on FPGA

〇Takuya Sakurai¹, Yosuke Hirata¹, Yuma Iwata¹, Keita Takebayashi¹, Jun-ichi Shirakashi¹ (1.Tokyo Univ. Agr. & Tech.)

Keywords:Feedback-Controlled Electromigration, Artificial Intelligence, Field Programmable Gate Array