The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[21p-235-1~12] 7.1 X-ray technologies

Fri. Sep 21, 2018 1:30 PM - 4:45 PM 235 (3F_Lounge2)

Takeshi Higashiguchi(Utsunomiya Univ.), Takeo Ejima(Tohoku Univ.), Mitsunori Toyoda(Tokyo Polytechnic Univ.)

2:15 PM - 2:30 PM

[21p-235-4] Rapid and Objective XRD Analysis of Multicomponent Specimen using Database

Masashi Ishii1, Tetsuya Ozawa2, Takayuki Konnya2 (1.NIMS, 2.Rigaku)

Keywords:x-ray diffraction, NNLS, cement

Crystal structure identification using x-ray diffraction technique is known to be hard work if multicomponent specimens should to be analyzed. We must use a lot of fitting parameters, resulting in long analyses time and ambiguity in the component identification. In this work, we propose a high-speed and objective analysis of XRD pattern using a spectrum database.