The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[21p-235-1~12] 7.1 X-ray technologies

Fri. Sep 21, 2018 1:30 PM - 4:45 PM 235 (3F_Lounge2)

Takeshi Higashiguchi(Utsunomiya Univ.), Takeo Ejima(Tohoku Univ.), Mitsunori Toyoda(Tokyo Polytechnic Univ.)

2:30 PM - 2:45 PM

[21p-235-5] Robust XRD Analysis of Multicomponent Specimen using NNLA

Masashi Ishii1, Tetsuya Ozawa2, Takayuki Konnya2 (1.NIMS, 2.Rigaku)

Keywords:x-ray diffraction, Robust analysis, fluctuation

For microscopic analysis using focusing beam, observed data are occasionally fluctuated with each measurement. We propose a fluctuation-robust analysis and demonstrate its applicability to x-ray diffraction. Although various loss functions have already been proposed in conventional robust analysis, the loss functions include a parameter to determine the robustness, suggesting implicit non-robustness due to the arbitral parameter. To avoid the implicit non-robustness, we demonstrate a least absolute value method without parameter.