Yumiko Takahashi

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Speaker, Author, Co-Author

Mon. Mar 19, 2018 9:30 AM - 11:30 AM P4 (P)

Poster presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[19a-P4-1~8] 15.7 Crystal characterization, impurities and crystal defects

9:30 AM - 11:30 AM

[19a-P4-4] Observation of strain field in Al ion-implanted silicon carbide crystals by reciprocal space mapping and angle-resolved X-ray topography

〇Yumiko Takahashi¹, Keiichi Hirano², Takayoshi Shimura³, Shinji Nagamachi⁴ (1.Nihon Univ., 2.KEK-PF, 3.Osaka Univ., 4.Nagamachi Science Laboratory Co., Ltd.)

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