Kousaku Shimizu

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 9:00 AM - 12:15 PM E201 (57-201)

Oral presentation
| 21 Joint Session K
| 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[18a-E201-1~11] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

11:15 AM - 11:30 AM

[18a-E201-8] Influence of annealing conditions Oxide semiconductoron TFT characteristics and reliability.

〇Kousaku Shimizu¹, Takuya Odakura¹, Toshio Morimoto², Tokuyuki Nakayama², Mana Shiraishi² (1.Nihon University, 2.SUMITOMO METAL MINING CO.,LTD.)