TaeEon Bae

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Speaker, Author, Co-Author

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P8 (P)

Poster presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[17p-P8-1~24] 13.5 Semiconductor devices and related technologies

1:30 PM - 3:30 PM

▲ [17p-P8-3] Effects of the impurity concentration in the Ge sources on the electrical properties of Ge/Si TFETs

〇(D)TaeEon Bae¹, Kimihiko Kato¹, Ryota Suzuki¹, Ryosho Nakane¹, Mitsuru Takenaka¹, Shinichi Takagi¹ (1.Tokyo Univ.)