Katsuyoshi Tasaki

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 9:00 AM - 12:00 PM C102 (52-102)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[18a-C102-1~11] 6.3 Oxide electronics

9:00 AM - 9:15 AM

[18a-C102-1] Estimation of band-edge fluctuation from temperature dependence on photo-current decay in polycrystalline ZnO thin films

〇(M1)Katsuyoshi Tasaki^1,2, Worasawat Suchada^1,2, Yoichiro Neo², Yoshinori Hatanaka¹, Hidenori Mimura² (1.Shizuoka Univ., 2.RIE)