Yukio Fujiwara

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 1:45 PM - 5:30 PM C201 (52-201)

Symposium (Oral)
| Symposium
| Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

[18p-C201-1~7] Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

3:15 PM - 3:45 PM

[18p-C201-4] Towards high lateral resolution and high sensitivity secondary ion mass spectrometry: cluster ion beam generation from a needle emitter wetted by protic ionic liquid

〇Yukio Fujiwara¹, Naoki Saito¹ (1.AIST)