Hitoshi Umezawa

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 1:45 PM - 6:00 PM F206 (61-206)

Oral presentation
| 6 Thin Films and Surfaces
| 6.2 Carbon-based thin films

[18p-F206-1~15] 6.2 Carbon-based thin films

2:00 PM - 2:15 PM

[18p-F206-2] Characterization of defects on diamond PiN junction by electron beam induced current

〇Hitoshi Umezawa^1,3, Takehiro Shimaoka², Satoshi Koizumi², Etienne Gheeraert³, Fabrice Donatini³, Toshiharu Makino¹, Yoshiaki Mokuno¹ (1.AIST, 2.NIMS, 3.Inst.Neel/CNRS)

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