WEI FU

→ Search for WEI FU in Google Scholar

Speaker, Author, Co-Author

Sun. Mar 18, 2018 4:00 PM - 6:00 PM P14 (P)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[18p-P14-1~19] 15.6 Group IV Compound Semiconductors (SiC)

4:00 PM - 6:00 PM

▲ [18p-P14-11] Stress distribution at SiO₂/4H-SiC interface studied by Confocal Raman Microscopy

〇(D)WEI FU¹, Ai Kobayashi¹, Hiroshi Yano¹, Shinsuke Harada², Takeaki Sakurai¹ (1.Tsukuba Univ, 2.AIST)