Ken Nakamura

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Chairperson, etc.

Sun. Mar 18, 2018 1:45 PM - 5:30 PM C201 (52-201)

Symposium (Oral)
| Symposium
| Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

[18p-C201-1~7] Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

Ken Nakamura(AIST), Yasuhito Gotoh(Kyoto Univ.)