〇Akinori Ubukata¹, Taketo Aihara², Hassanet Sodabanlu³, Ryuji Ohima², Takeyoshi Sugaya², Yoshiki Yano¹, Toshiya Tabuchi¹, Koh Matsumoto¹, Yoshiaki Nakano⁴, Masakazu Sugiyama³ (1.Taiyo Nippon Sanso Corp., 2.AIST, 3.RCAST, The Univ. of Tokyo, 4.School of Engineering, The Univ. of Tokyo)

〇(M1)Shunji Goto¹, Akihiro Ohtake², Akira Akaishi¹, Jun Nakamura¹ (1.UEC-Tokyo, 2.NIMS)

〇Tanaka Shunsuke¹, Keisuke Yamane¹, Masaya Goto¹, Hiroto Sekiguchi¹, Hiroshi Okada¹, Akihiro Wakahara¹ (1.Toyohashi Tech.)

〇Boram Kim¹, Oliver Supplie², Agnieszka Pasazuk², Thomas Hannappel², Yoshiaki Nakano¹, Masakazu Sugiyama¹ (1.Tokyo Univ., 2.TU Ilmenau)

〇Tetsuaki Okada¹, Kim Boram¹, Oliver Supplie², Agnieszka Pasazuk², Thomas Hannappel², Yoshiaki Nakano¹, Masakazu Sugiyama¹ (1.Univ. Tokyo, 2.TU Ilmenau)

〇Ryo Nakao^1,2, Tomonari Sato¹, Hiroki Sugiyama¹, Shinji Matsuo^1,2 (1.NTT Device Technology Labs., 2.NTT Nanophotonics Center)

〇Hirofumi Yoshikawa^1,2,3, Jinkwan Kwoen¹, Takahiro Doe^1,3, Makoto Izumi³, Satoshi Iwamoto^1,2, Yasuhiko Arakawa^1,2 (1.NanoQuine, Univ. of Tokyo, 2.IIS, Univ. of Tokyo, 3.SHARP)

〇Toshiyuki Kaizu^1,2, Takaaki Koike¹, Takashi Kita¹ (1.Faculty of Eng., Kobe Univ, 2.CSREA, Kobe Univ.)

〇(M1)Mikihito Suzuki¹, Kenichi Shimomura¹, Itaru Kamiya¹ (1.Toyota Tech. inst.)

〇(M1)Ryo Sugiyama¹, Sho Tatsugi¹, Koichi Yamaguchi¹ (1.Univ. of Electro-Comm.)

〇Toui Higuchi¹, Akira Tsukamoto¹, Eigo Ito¹, Saburo Tanaka¹, Fumitaro Ishikawa¹, Satoshi Shimomura¹ (1.Ehime Univ.)

〇(M1)Akira Tsukamoto¹, Itou Eigo¹, Higaki Kouichiro¹, Tanaka Saburo¹, Ishikawa Humitaro¹, Shimomura Satoshi¹ (1.Ehime Univ.)

〇Sho Hasegawa¹, Kyohei Kakuyama¹, Suzuki Kosaku¹, Hiroyuki Nishinaka¹, Masahiro Yoshimoto¹ (1.Kyoto Inst.Tech.)

〇(P)Pallavi Patil^1,2, Fumitaro Ishikawa², Satoshi Shimomura², Hiroyuki Nishinaka¹, Masahiro Yoshimoto¹ (1.Department of Electronics & Information Science, Kyoto Institute of Technology, Sakyo, Kyoto 606-8585, Japan, 2.Graduate School of Science and Engineering, Ehime University, 3 Bunkyo-cho, Matsuyama, Ehime, Japan)