The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.4 Buried interface sciences with quantum beam

[17a-F202-1~11] 7.4 Buried interface sciences with quantum beam

Sat. Mar 17, 2018 9:00 AM - 12:15 PM F202 (61-202)

Masaki Hada(Okayama Univ.), Masamitsu Takahasi(QST), Shushi Suzuki(Nagoya Univ.)

10:45 AM - 11:15 AM

[17a-F202-7] [INVITED] Hard X-ray Photoemission Spectroscopy with Synchrotron Radiation
for Observations Electronic states in Bulk and Buried interfaces

Eiji Ikenaga1,2 (1.Nagoya Univ., 2.JASRI)

Keywords:Hard X-ray photoemission spectroscopy

HAXPES is recognized a powerful tool for investigating the chemical states and electronic structures of various materials with third generation high-brilliance synchrotron radiation sources. The most advantageous feature of HAXPES is enabling us to measure intrinsically bulk sensitive electronic structures and buried interface profiles. The large depth of the information provided by HAXPES has expand various applications both in basic and applied research fields. Furthermore, We have developed the ambient pressure cell which could keep the environments for wet sample including H2O adsorption in a high vacuum successfully and realized to observe the electronic states of the solution sample using hard X-ray photoemission spectroscopy (HAXPES) at BL47XU in SPring-8.