[17a-F202-1~11] 7.4 Buried interface sciences with quantum beam

[17a-F202-9] Dispersive X-ray scattering measurements for time-resolved observation of thin films

〇Wolfgang Voegeli¹, Etsuo Arakawa¹, Toshio Takahashi¹, Tetsuroh Shirasawa^2,3, Hiroo Tajiri⁴, Masamitu Takahasi⁵, Takuo Sasaki⁵, Tadashi Matsushita⁶ (1.Tokyo Gakugei Univ., 2.AIST, 3.JST-PRESTO, 4.JASRI/SPring-8, 5.QST, 6.KEK-PF)

Keywords:X-ray scattering, time-resolved measurement

A recently developed method for time-resolved measurements of X-ray reflectivity, CTR scattering and reciprocal space mapping will be presented, which uses monochromatic synchrotron radiation from 3rd generation undulator sources. It makes time-resolved observations with a time resolution down to 10 ms possible. The principle of the method and results of test experiments will be presented.