The 65h JSAP Spring Meeting, 2018

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Poster presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[17p-P5-1~14] 6.6 Probe Microscopy

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P5 (P)

1:30 PM - 3:30 PM

[17p-P5-11] Non-destructive local electrical conductivity measurement by using a multi-probe STM

〇Hiroyuki Mogi1, Takafumi Bamba1, Osamu Takeuchi1, Hidemi Shigekawa1 (1.Univ. of Tsukuba)

Keywords:multi-probe STM, conductivity measurement