The 65h JSAP Spring Meeting, 2018

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[17p-P5-1~14] 6.6 Probe Microscopy

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P5 (P)

1:30 PM - 3:30 PM

[17p-P5-7] FM–AFM analysis of Si / ionic liquid interface during lithium ion insertion process

Kazuyuki Itakura1, Yuya Takara1, Takashi Ichii1, Toru Utsunomiya1, Hiroyuki Sugimura1 (1.Kyoto Univ.)

Keywords:atomic force microscopy, lithium ion battery, ionic liquid