The 65h JSAP Spring Meeting, 2018

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[17p-P5-1~14] 6.6 Probe Microscopy

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P5 (P)

1:30 PM - 3:30 PM

[17p-P5-9] Development of multi-environment atomic force microscope for observation of ice surface structure (2)

Yuji Miyato1, Katsuki Otani1, Ken Nagashima2, Masayuki Abe1 (1.Osaka Univ., 2.Hokkaido Univ.)

Keywords:atomic force microscopy, qPlus sensor, ice crystal

The goal of this study is to reveal the growth process of ice crystals from the surface observation by AFM. For the in-situ observation during the growth, the AFM using a qPlus sensor has been developed, equipped with a multi-environmental control system to adjust the air pressure, temperature, and humidity near the sample as well as the temperature of the sample substrate as a seed crystal. In this presentation, the improvement of our AFM will be explained, in addition to the measurement results of ice crystals grown on the substrates.