The 65h JSAP Spring Meeting, 2018

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13 Semiconductors » 13.5 Semiconductor devices and related technologies

[17p-P8-1~24] 13.5 Semiconductor devices and related technologies

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P8 (P)

1:30 PM - 3:30 PM

[17p-P8-20] RTN Impact on Data-Retention Failure/Recovery Mechanism in Sub-20nm NAND Flash Memories

〇Kyoji Mizoguchi1, Tomonori Takahashi1, Ken Takeuchi1 (1.Chuo Univ.)

Keywords:NAND flash memory, Random telegraph noise