High Reliability Techniques of 3D-NAND Flash Memories by Lateral Charge Migration Suppression

Presentation information

Poster presentation

13 Semiconductors » 13.5 Semiconductor devices and related technologies

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P8 (P)

1:30 PM - 3:30 PM

〇Kyoji Mizoguchi¹, Shohei Kotaki¹, Yoshiaki Deguchi¹, Ken Takeuchi¹ (1.Chuo Univ.)

Keywords:NAND flash memory, Solid-state-drive, Charge migration