The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal characterization, impurities and crystal defects

[18a-D103-1~10] 15.7 Crystal characterization, impurities and crystal defects

Sun. Mar 18, 2018 9:00 AM - 11:45 AM D103 (56-103)

Toshiaki Ono(SUMCO), Hiroki Kawai(Toshiba)

9:45 AM - 10:00 AM

[18a-D103-4] Impact of CO Generation during Melting Process on Carbon Concentration in Czochralski Silicon

Yuta Nagai1, Hiroyuki Tsubota1, Hisashi Matsumura1 (1.GlobalWafers Japan)

Keywords:Silicon, Crystal growth, Carbon concentration