Outdoor PID acceleration test for p-type crystalline Si photovoltaic modules under different light irradiation conditions

Yasushi Tachibana; Takeshi Toyoda; Toshiharu Minamikawa; Kinichi Ogawa; Yukiko Hara; Keiichiro Sakurai; Atsushi Masuda

Presentation information

Oral presentation

16 Amorphous and Microcrystalline Materials » 16.3 Bulk, thin-film and other silicon-based solar cells

[18p-D101-1~17] 16.3 Bulk, thin-film and other silicon-based solar cells

Sun. Mar 18, 2018 1:15 PM - 6:00 PM D101 (56-101)

Koji Arafune(Univ. of Hyogo), Fumitaka Ohashi(Gifu Univ.), Chikao Okamoto(Sharp)

5:30 PM - 5:45 PM

[18p-D101-16] Outdoor PID acceleration test for p-type crystalline Si photovoltaic modules under different light irradiation conditions

〇Yasushi Tachibana¹, Takeshi Toyoda¹, Toshiharu Minamikawa¹, Kinichi Ogawa², Yukiko Hara², Keiichiro Sakurai², Atsushi Masuda² (1.IRII, 2.AIST)

Keywords:Potential induced degradation (PID), Light irradiation, Reverse bias voltage application

Both the suppression of PID by light irradiation and the promotion of PID by reverse bias voltage application confirmed by indoor PID acceleration tests were also found by the outdoor PID acceleration tests under different light irradiation conditions. It is possible that PID promotion and suppression effects occur for fully shadowed cell and light-irradiated cell, respectively.