The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal characterization, impurities and crystal defects

[18p-D103-1~23] 15.7 Crystal characterization, impurities and crystal defects

Sun. Mar 18, 2018 1:15 PM - 7:30 PM D103 (56-103)

Kentaro Kutsukake(Nagoya Univ.), Yutaka Ohno(Tohoku Univ.), Hiroaki Kariyazaki(GWJ), Shotaro Takeuchi(Ohsaka Univ.)

4:00 PM - 4:15 PM

[18p-D103-11] Dependence of oxygen on dislocation density in Si single crystal for solar cells during solidification and cooling process

Tomoro Ide1, 〇Satoshi Nakano2, Hirofumi Harada2, Yoshiji Miyamura2, Koichi Kakimoto1,2 (1.Kyushu Univ., 2.RIAM, Kyushu Univ.)

Keywords:dislocation

Dislocation is one of the main factor to decrease conversion efficiency for Si single crystal for solar cells. It has been reported that oxygen atoms in Si single crystal decrease velocity of dislocation motion and restrain dislocation multiplication under low stress. In this study, we investigated the relation between oxygen atoms in the Si single crystal and dislocation multiplication during solidification and cooling process by numerical analysis.