The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal characterization, impurities and crystal defects

[18p-D103-1~23] 15.7 Crystal characterization, impurities and crystal defects

Sun. Mar 18, 2018 1:15 PM - 7:30 PM D103 (56-103)

Kentaro Kutsukake(Nagoya Univ.), Yutaka Ohno(Tohoku Univ.), Hiroaki Kariyazaki(GWJ), Shotaro Takeuchi(Ohsaka Univ.)

4:30 PM - 4:45 PM

[18p-D103-13] Carbon Analysis using Room-Temperature Photoluminescence around C-line in Electron-Irradiated Si

Yoichiro Ishikawa1, Michio Tajima1, Hirotatsu Kiuchi1, Kazuchi Miyoshi1, Atsushi Ogura1 (1.Meiji Univ.)

Keywords:Silicon, Photoluminescence, Carbon impurity