5:15 PM - 5:30 PM
[18p-D103-15] Oxygen concentration in thin silicon wafer for solar cell determined by FT-IR measurement
Keywords:FT-IR, silicon, oxygen concentration
Presentation information
Oral presentation
15 Crystal Engineering » 15.7 Crystal characterization, impurities and crystal defects
[18p-D103-1~23] 15.7 Crystal characterization, impurities and crystal defects
Sun. Mar 18, 2018 1:15 PM - 7:30 PM D103 (56-103)
Kentaro Kutsukake(Nagoya Univ.), Yutaka Ohno(Tohoku Univ.), Hiroaki Kariyazaki(GWJ), Shotaro Takeuchi(Ohsaka Univ.)