[18p-F210-1~10] The forefront of tip-enhanced Raman spectroscopy

[18p-F210-4] Silver nanowire-based tip for tip-enhanced Raman scattering Microscopy

Yasuhiko Fujita¹, Tomoko Inose², 〇Hiroshi Uji-i^2,3 (1.Today Research Centre Inc., 2.RIES, Hokkaido Univ., 3.KU Leuven)

Keywords:Tip-enhanced Raman scattering, Silver nanowire

Tip-enhanced Raman scattering (TERS) microscopy is a powerful variant of surface enhanced Raman scattering (SERS) spectroscopy combined with scanning probe microscopy (SPM), such as scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). This technique allows us to obtain both chemical and topographical information simultaneously with nanometre resolution. TERS activity is attributed to the excitation of the localized surface plasmons at an apex of a metalized SPM tip upon light illumination. Therefore, control of tip shape is a key issue for efficient TERS microscopy. Attaching a number of wet-chemically synthesized AgNWs attached on a W tip apex using electrophoresis (Fig.1a), we successfully obtained atomic resolution graphite lattice image (Fig1b). Thanks to the quality of wet-chemically synthesized Ag NWs, nearly 100 % of AgNW-tips exhibit TERS activity, revealing excellent reproducible TERS measurements.