5:45 PM - 6:00 PM
[18p-G203-18] VTH Modulation with Word-Line Unit of TLC NAND Flash Memories Considering Write Frequencies of Data
Keywords:TLC NAND flash memory, reliability
Oral presentation
13 Semiconductors » 13.5 Semiconductor devices and related technologies
Sun. Mar 18, 2018 1:15 PM - 6:00 PM G203 (63-203)
Masumi Saitoh(TOSHIBA), Kousuke Miyaji(Shinshu Univ.)
5:45 PM - 6:00 PM
Keywords:TLC NAND flash memory, reliability