2018年第65回応用物理学会春季学術講演会

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13 半導体 » 13.2 探索的材料物性・基礎物性

[18p-P6-1~18] 13.2 探索的材料物性・基礎物性

2018年3月18日(日) 13:30 〜 15:30 P6 (ベルサール高田馬場)

13:30 〜 15:30

[18p-P6-10] Surface passivation effect of RF-plasma processed a-Si:H layers
on the optical properties of BaSi2 epitaxial films

〇(M2)Zhihao Xu1、Kazuhiro Gotoh2、Tianguo Deng1、Kaoru Toko1、Noritaka Usami2、Takashi Suemasu1 (1.Univ Tsukuba、2.Nagoya Univ)

キーワード:BaSi2

BaSi2 is a good candidate for future solar cells. It has many advantages such as a band gap of 1.3 eV, suitable for the solar spectrum, a large absorption coefficient of 3 × 104 cm-1 at 1.5 eV, exceeding those of CIGS, and a large minority-carrier diffusion length of ca. 10 μm. In our previous work, we have realized the conversion efficiency of 9.9% in a p-BaSi2/n-Si (111) heterojunction solar cell capped with pure amorphous Si (a-Si) layers. They have, however, a lot of dangling bonds to hinder the performance of solar cell. An alternative is hydrogenated a-Si (a-Si:H) layer. We have already confirmed that a-Si:H can be grown by MBE method and radio-frequency (RF) plasma generator. In this study, we investigated the effect of a-Si:H capping layers on the optical properties of crystalline Si (c-Si) substrates and BaSi2 epitaxial films.