2018年第65回応用物理学会春季学術講演会

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一般セッション(口頭講演)

15 結晶工学 » 15.6 IV族系化合物(SiC)

[19a-D103-1~12] 15.6 IV族系化合物(SiC)

2018年3月19日(月) 09:00 〜 12:15 D103 (56-103)

太子 敏則(信州大)

12:00 〜 12:15

[19a-D103-12] A study of the CVD growth condition for filling 50-μm 4H-SiC deep trench

Shiyang Ji1、Ryoji Kosugi1、Kazutoshi Kojima1、Kohei Adachi1,2、Yasuyuki Kawada1,3、Kazuhiro Mochizuki1,4、Akiyo Nagata1、Yasuko Matsukawa1、Yoshiyuki Yonezawa1、Sadafumi Yoshida1、Hajime Okumura1 (1.AIST、2.Mitsubishi Electric、3.Fuji Electric、4.Hitachi Ltd.)

キーワード:trench filling, silicon carbide, CVD

Different with the shallow trench filling, there have some new problems in filling 50-um 4H-SiC deep trench, which were addressed and studied in this work. Then, the revision of CVD growth condition was proposed. Finally, the complete fill of the deepest 4H-SiC trench to now, was achieved.