The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

[19a-D103-1~12] 15.6 Group IV Compound Semiconductors (SiC)

Mon. Mar 19, 2018 9:00 AM - 12:15 PM D103 (56-103)

Toshinori Taishi(Shinshu Univ.)

9:30 AM - 9:45 AM

[19a-D103-3] Measurement of melt properties of Si-40mol%Cr solvent and influence to SiC in the solution growth

〇(D)Hironori Daikoku1, Sakiko Kawanishi2, Takehiko Ishikawa3, Takeshi Yoshikawa1 (1.Univ. Tokyo, 2.Tohoku Univ., 3.JAXA)

Keywords:SiC, Solution growth

To develop the SiC growth with large diameter and high growth rate by solution growth, the accurate control of temperature and velocity distribution by CFD simulation is needed. The physical properties of Si have been used as that of solution. In this study, The density, viscosity and surface tension of Si-40mol%Cr alloy were measured by electrostatic levitation. In addition, the temprature and velocity distribution were calculated using the physical properties of Si and Si-40mol%Cr by CFD simulation.