High-resolution imaging of silicene on an Ag(111) surface by atomic force microscopy

Keisuke Yabuoshi; Jo Onoda; Hiroki Miyazaki; Yoshiaki Sugimoto

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[19p-F210-1~16] 6.6 Probe Microscopy

Mon. Mar 19, 2018 1:15 PM - 5:30 PM F210 (61-210)

Yoichi Otsuka(Osaka Univ.), Akira Sasahara(Kobe Univ.)

1:30 PM - 1:45 PM

[19p-F210-2] High-resolution imaging of silicene on an Ag(111) surface by atomic force microscopy

〇(M1C)Keisuke Yabuoshi¹, Jo Onoda¹, Hiroki Miyazaki¹, Yoshiaki Sugimoto¹ (1.Univ. of Tokyo)

Keywords:atomic force microscope, silicene

In this reserch, silicene on an Ag(111) surface was measured in real space by atomic force microscopy.
As a result, we successfully imaged the atoms, which has not been imaged by previous researches.