The 65h JSAP Spring Meeting, 2018

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15 Crystal Engineering » 15.5 Group IV crystals and alloys

[19p-P10-1~6] 15.5 Group IV crystals and alloys

Mon. Mar 19, 2018 4:00 PM - 6:00 PM P10 (P)

4:00 PM - 6:00 PM

[19p-P10-5] Evaluation of critical thickness for Si1-xGex layers grown on Ge(111) substrates

〇(M2)Yu Sakamoto1, Michihiro Yamada2, Kohei Hamaya2, Kentarou Sawano1 (1.Tokyo City Univ, 2.Osaka Univ)

Keywords:Ge(111)