The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

2 Ionizing Radiation » 2.2 Detection systems

[20a-A304-1~12] 2.2 Detection systems

Tue. Mar 20, 2018 9:00 AM - 12:00 PM A304 (54-304)

Takeshi Fujiwara(AIST)

9:45 AM - 10:00 AM

[20a-A304-4] Evaluation of α- and β-SiAlON scintillators by ion-beam-induced luminescence analysis

Wataru Kada1, Ivan Sudic2, Natko Skukan2, Junichi Susaki3, Suzuya Yamada3, Takahiro Sekine1, Kenta Miura1, Takahiro Satoh4, Masashi Koka5, Naoto Yamada4, Tomihiro Kamiya1, Milko Jaksic2, Osamu Hanaizumi1 (1.Gunma University, 2.RBI, 3.Denka Co. Ltd, 4.TARRI, QST, 5.Beam Operation Ltd)

Keywords:IBIL, SiAlON, Temperature Resistant

In this research, ion beam induced luminescence (IBIL) measurement for SiAlON phosphor was demonstrated with an aim of developing a scintillator that operates under harsh and high temperature environments. House-made temperature controller was installed at the end terminal of a focused ion beam irradiation system and IBIL from SiAlON scintillator under beam irradiation was measured for each temperature. IBIL obtained from β-SiAlON (MW 540 H) sample maintained approximately half value of IBIL intensity even at about 773 K comparing to that of original obtained at room temperature. According to this result, we confirmed that SiAlON scintillator could be used at high temperature environment.