The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[20a-B303-1~11] 7.2 Applications and technologies of electron beams

Tue. Mar 20, 2018 9:45 AM - 12:45 PM B303 (53-303)

Yoichiro Neo(Shizuoka Univ.)

11:30 AM - 11:45 AM

[20a-B303-7] Improvement of a number of active tips and emission measurements from individual tips in volcano-structured Spindt-type field emitter arrays

Kodai Taguchi1,2, Hidetoshi Shinya1, 〇Hidekazu Murata1, Eiji Rokuta1, Hiroshi Shimoyama1, Masayoshi Nagao2, Katsuhisa Murakami2 (1.Meijo Univ., 2.AIST)

Keywords:Field Emitter Array, PEEM, Opearation rate

We have developed an electron optical instrument for evaluation of multi emitters. The instrument is a versatile emission microscope and is capable of operating as SEEM, PEEM and FEEM imaging modes. In this study, volcano-structured Spindt-type field emitter arrays are observed in PEEM and FEEM modes using the instrument. In addition, emission current measurement from individual active tips in field emitter arrays is performed. As a result, we have found that there are large differences in emission current among active tips, and that a number of active tips is greatly improved by aging the field emitter arrays at a relatively higher voltage (VG = 100 V).