11:00 AM - 11:15 AM
[20a-B403-8] Detection Sensitivity Improvement of Secondary Ion by Sodium Absorption with mist deposition method on PEG Surface
Keywords:SIMS, cationization, cruster
Oral presentation
7 Beam Technology and Nanofabrication » 7.5 Ion beams
Tue. Mar 20, 2018 9:00 AM - 11:45 AM B403 (53-403)
Toshio Seki(Kyoto Univ.), Junichi Yanagisawa(Univ. of Shiga Pref.)
11:00 AM - 11:15 AM
Keywords:SIMS, cationization, cruster