[20a-P9-1~12] 16.3 Bulk, thin-film and other silicon-based solar cells

[20a-P9-7] Influence of potential induced degradation test on solar cell surface analyzed by conductive atomic force microscopes

〇Hiroya Kosuga¹, Fumitaka Ohashi¹, Hiroki Yoshida¹, Yoshiki Mizuno¹, Yukiko Hara², Atsushi Masuda², Shuichi Nonomura¹ (1.Gifu Univ., 2.AIST)

Keywords:potential induced degradation